Dataset: Surface reconstructions and electronic structure of metallic delafossite thin films

Authors: Qi Song¹, Zhiren He², Brendan D. Faeth³, Christopher T. Parzyck⁴, Anna Scheid⁵, Chad J. Mowers⁴, Yufan Feng^{6, 7}, Qing Xu⁶, Sonia Hasko⁶, Jisung Park¹, Matthew R. Barone⁶, Y. Eren Suyolcu⁵, Peter A. van Aken⁵, Betül Pamuk^{6, 8}, Craig J. Fennie², Phil D. C. King⁹, Kyle M. Shen^4,10, Darrell G. Schlom^{1,10, 11}

Author affiliations:
^1:Department of Materials Sciences and Engineering, Cornell University, Ithaca, New York 14853, USA
²:Department of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
³:Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, New York 14853, USA
⁴:Department of Physics, Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14853, USA
⁵:Max Planck Institute for Solid State Research, Heisenbergstrasse 1, Stuttgart 70569, Germany
⁶:Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, New York 14853, USA
⁷:Robert Frederick Smith School of Chemical and Biomolecular Engineering, Cornell University, Ithaca, New York 14853, USA
⁸:Department of Physics, Williams College, Williamstown, Massachusetts 01267, USA
⁹:SUPA, School of Physics and Astronomy, University of St Andrews, St Andrews KY16 9SS, UK
¹⁰:Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA
¹¹:Leibniz-Institut für Kristallzüchtung, Max-Born-Straße 2, 12489 Berlin, Germany

Photoemission spectroscopy of PtCoO₂₂₂ thin films provides evidence of surface reconstructions not reported in prior studies of delafossites. Relevant characterizations, including electron diffractions and X-ray diffraction, as well as electrical transport of these metallic delafossite films, are provided.