A new STEM technique is demonstrated that can determine the structural heterogeneity in disordered materials by analyzing the intensity variation of the electron nanodiffraction patterns acquired using a pixelated STEM detector. It provides precise details of the heterogeneity, such as the type, size, distribution, and volume fraction of medium range atomic ordering, which are related to the important properties of disordered materials.
This data is associated with corresponding paper doi: 10.1016/j.ultramic.2018.09.005.
