Dataset contains, comprehensive Molecular-beam epitaxy (MBE) growth parameters i.e. substrate and source temperature of all the sources present in the chamber during growth as well as background pressure and rotation speed. Reflective High-energy electron diffraction (RHEED) videos and Images were recored before, during and after each sample was grown. Additionally, characterization in form of X-ray diffraction (XRD) in there unaltered form are attached.
| MBE Growth Logs | ||
|---|---|---|
| Item | Type | File |
| MBE Growth Logs - MBE Growth of Sample 183 | zip | MBE Growth Logs/KTO_0183-TSO substrate.zip |
| MBE Growth Logs - MBE Growth of Sample 203 | zip | MBE Growth Logs/KTO_0203-KTO 100.zip |
| MBE Growth Logs - MBE Growth of Sample 205 | zip | MBE Growth Logs/KTO_0205-KTO 100.zip |
| RHEED | ||
| Item | Type | File |
| RHEED - RHEED of Sample 183 | zip | RHEED/KTO_0183.zip |
| RHEED - RHEED of Sample 205 | zip | RHEED/KTO_0205.zip |
| XRD | ||
| Item | Type | File |
| XRD - Xray Diffraction of KTO Sample 183 | text | XRD/KTO_0183_XRD.txt |
| XRD - Xray Reflectivity of KTO Sample 183 | text | XRD/KTO_0183_XRR.txt |
| XRD - Xray Diffraction of KTO Sample 203 | text | XRD/KTO_0203_XRD.txt |
| XRD - Xray Reflectivity of KTO Sample 203 | text | XRD/KTO_0203_XRR.txt |
| XRD - Xray Diffraction of KTO Sample 205 | text | XRD/KTO_0205_XRD.txt |
