Dataset: Atomic-scale tracking of topological defect motion and incommensurate charge order melting

https://doi.org/10.34863/m8c5-k998
Authors: Noah Schnitzer ORCID logo 1, Berit H. Goodge ORCID logo 2, Gregory Powers ORCID logo 2, Jaewook Kim ORCID logo 3, Sang-Wook Cheong ORCID logo 4, Ismail El Baggari ORCID logo 5, Lena F. Kourkoutis ORCID logo 2,6
Author affiliations:
1:Department of Materials Science and Engineering, Cornell University, Ithaca, NY, 14853 USA
2:Department of Applied and Engineering Physics, Cornell University, Ithaca, NY, 14853 USA
3:Korea Atomic Energy Research Institute: Daejeon, South Korea
4:Department of Physics and Astronomy, Rutgers University, Piscataway, NJ 08854 USA
5:Rowland Institute at Harvard University, Cambridge, MA 02138 USA
6:Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, 14853 USA
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Atomic resolution high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and selected area electron diffraction (SAED) datasets acquired on a single crystal of the charge ordered manganite (Bi,Sr,Ca)MnO3. These datasets are acquired at variable cryogenic temperatures, revealing the melting of charge order and motion of topological defects in the material through tracking the same fields of view across temperature steps. All STEM data are rapidly acquired image stacks which were registered and averaged in post processing, only the final averaged images are included here. The HAADF image series are sets of these registered images acquired sequentially at through temperature cycles, the temperature of each image in the series can be found in the Datasets_temperatures.csv file. The aligned_HAADF_series files were additionally carefully aligned to show precisely the same field of view through the full temperature cycle, allowing the motion of topological defects and nature of local order and disorder to be tracked. 

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Dataset Acquisition Temperatures
ItemTypeFile
Temperatures (K) of each frame of each datasetdataDataset Acquisition Temperatures/Datasets_temperatures.csv
Figure 1
ItemTypeFile
Aligned HAADF image series 10 (frame 4 shown in figure)imageFigure 1/aligned_HAADF_series_10.tif
Lower magnification overview registered HAADF image 0322imageFigure 1/registered_image_0322 936.7 kx.tif
Figure 2
ItemTypeFile
Selected area electron diffraction pattern series through two sequential temperature cyclesimageFigure 2/SAED_series.tif
Figure 4
ItemTypeFile
Aligned HAADF image series 99imageFigure 4/aligned_HAADF_series_99.tif
Figure 6
ItemTypeFile
HAADF image series 11 (frame 5 in figure)imageFigure 6/HAADF_series_11.tif
Figures 3 and 5
ItemTypeFile
Aligned HAADF image series 3imageFigures 3 and 5/aligned_HAADF_series_3.tif
Supplemental Figure 1
ItemTypeFile
Experimental temperature control logdataSupplemental Figure 1/20220113_BSCMO.csv
Supplemental Figure 13
ItemTypeFile
Registered high sampling rate HAADF imageimageSupplemental Figure 13/registered_image_0318 1.9 Mx.tif
Registered low sampling rate HAADF imageimageSupplemental Figure 13/registered_image_0318 936.7 kx.tif
Supplemental Figure 3
ItemTypeFile
HAADF image series 8imageSupplemental Figure 3/HAADF_series_8.tif