Dataset: Colossal Cryogenic Electro-Optic Response Through Metastability in Strained BaTiO3 Thin Films

https://doi.org/10.34863/k6vg-fr77
Authors: A. Suceava ORCID logo 1, S. Hazra ORCID logo 1, A. Ross ORCID logo 1, I.R. Philippi ORCID logo 1,2, D. Sotir ORCID logo 3,4, B. Brower ORCID logo 2, L. Ding5, Y. Zhu5, Z. Zhang ORCID logo 5, H. Sarkar ORCID logo 1, S. Sarker8, Y. Yang5,6,7, V.A. Stoica1, D.G. Schlom ORCID logo 4,9,10, L.Q. Chen ORCID logo 1, V. Gopalan ORCID logo 1,2
Author affiliations:
1:Department of Materials Science and Engineering The Pennsylvania State University University Park, PA 16802, USA
2:Department of Physics The Pennsylvania State University University Park, PA 16802, USA
3:Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM) Cornell University Ithaca, NY 14853, USA
4:Department of Materials Science and Engineering Cornell University Ithaca, NY 14853, USA
5:Department of Engineering Science and Mechanics The Pennsylvania State University University Park, PA 16802, USA
6:Department of Nuclear Engineering The Pennsylvania State University University Park, PA 16802, USA
7:Materials Research Institute The Pennsylvania State University University Park, PA 16802, USA
8:Cornell High Energy Synchrotron Source Cornell University Ithaca, NY 14853, USA
9:Kavli Institute at Cornell for Nanoscale Science Ithaca, NY 14853, USA
10:Leibniz-Institut für Kristallzüchtung Max-Born-Straße 2, 12489 Berlin, Germany

Data from the synthesis and characterization of a BaTiO3 thin film grown on a GdScO3 (110) substrate, performed in the PARADIM Thin Film Facility. The data includes in-situ RHEED images, atomic force microscopy (AFM) images of the film surface, an theta-2theta x-ray diffraction scan, an asymmetric reciprocal space map taken at the GdScO3 332 Bragg peak, and omega rocking scans taken at both the BaTiO3 002 and GdScO3 220 Bragg peaks.

AFM
ItemTypeFile
AFM - AFM of Sample BTO_32dataAFM/BTO_32_0000.ibw
MBE Growth
ItemTypeFile
MBE Growth - Growth file for sample BTO_32zipMBE Growth/PDC_MBE316GM1_20230817_A_232_(BTO_32).zip
RHEED Characterization
ItemTypeFile
RHEED Characterization - Raw IMG for Sample BTO_32_60mins_294dataRHEED Characterization/BTO_32_60mins_294.img
RHEED Characterization - PNG for Sample BTO_32_60mins_294imageRHEED Characterization/BTO_32_60mins_294.png
RHEED Characterization - Raw IMG for Sample BTO_32_60mins_339dataRHEED Characterization/BTO_32_60mins_339.img
RHEED Characterization - PNG for Sample BTO_32_60mins_339imageRHEED Characterization/BTO_32_60mins_339.png
XRD
ItemTypeFile
XRD - XRD Data of sample BTO_32dataXRD/BTO_32_xrd.xrdml