Data from the synthesis and characterization of a BaTiO3 thin film grown on a GdScO3 (110) substrate, performed in the PARADIM Thin Film Facility. The data includes in-situ RHEED images, atomic force microscopy (AFM) images of the film surface, an theta-2theta x-ray diffraction scan, an asymmetric reciprocal space map taken at the GdScO3 332 Bragg peak, and omega rocking scans taken at both the BaTiO3 002 and GdScO3 220 Bragg peaks.
| AFM | ||
|---|---|---|
| Item | Type | File |
| AFM - AFM of Sample BTO_32 | data | AFM/BTO_32_0000.ibw |
| MBE Growth | ||
| Item | Type | File |
| MBE Growth - Growth file for sample BTO_32 | zip | MBE Growth/PDC_MBE316GM1_20230817_A_232_(BTO_32).zip |
| RHEED Characterization | ||
| Item | Type | File |
| RHEED Characterization - Raw IMG for Sample BTO_32_60mins_294 | data | RHEED Characterization/BTO_32_60mins_294.img |
| RHEED Characterization - PNG for Sample BTO_32_60mins_294 | image | RHEED Characterization/BTO_32_60mins_294.png |
| RHEED Characterization - Raw IMG for Sample BTO_32_60mins_339 | data | RHEED Characterization/BTO_32_60mins_339.img |
| RHEED Characterization - PNG for Sample BTO_32_60mins_339 | image | RHEED Characterization/BTO_32_60mins_339.png |
| XRD | ||
| Item | Type | File |
| XRD - XRD Data of sample BTO_32 | data | XRD/BTO_32_xrd.xrdml |
