Authors: Monique Kubovsky1, Yorick A. Birkhölzer2, Luka B. Mitrovic2, Hanjong Paik1,2, George R. Rossman3, Darrell G. Schlom1,2,4,5
Author affiliations: 1:Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, New York 14853, USA 2:Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA 3:Division of Geology and Planetary Science, California Institute of Technology, Pasadena, Califronia 91125, USA 4:Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA 5:Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany
Here we share the MBE log files that were generated during the epitaxial growth of thin films on the three substrates presented in this paper. Additionally, we also share AFM and RHEED images as well as XRD data.