Dataset: Controlling the p-type conductivity of α-SnO thin films by potassium doping

https://doi.org/10.34863/4cdx-6j33
Authors: S. Chae ORCID logo 1, S. Lee ORCID logo 1, A. Park ORCID logo 1, M.K.I. Senevirathna ORCID logo 2, Y. Feng ORCID logo 3, V. Kanneboina ORCID logo 4,5, V-A. Ha ORCID logo 6,7, Y. Hu ORCID logo 8, C. Du ORCID logo 9, M. Barone ORCID logo 10, V. Protasenko ORCID logo 11, Y.E. Li ORCID logo 1, N. Podraza4,5, K. Johnson ORCID logo 2, D. Jena ORCID logo 1,11,12, H.G. Xing ORCID logo 1,11,12, X.Q. Pan ORCID logo 9, K. Cho ORCID logo 8, F. Giustino ORCID logo 6, M.D. Williams ORCID logo 2, D.G. Schlom ORCID logo 1,12,13,a
Author affiliations:
1:Department of Materials Science and Engineering, Cornell University ,Ithaca, New York 14853, USA
2:Department of Physics, Clark Atlanta University, Atlanta, Georgia 30314, USA
3:Robert Frederick Smith School of Chemical and Biomolecular Engineering, Cornell University, Ithaca, New York 14853, USA
4:Department of Physics and Astronomy, The University of Toledo, Toledo, Ohio 43606, USA
5:Wright Center for Photovoltaics Innovation and Commercialization, The University of Toledo, Toledo, Ohio 43606, USA
6:Oden Institute for Computational Engineering and Sciences, The University of Texas at Austin, Austin, Texas 78712, USA
7:Department of Physics, The University of Texas at Austin, Austin, Texas 78712, USA
8:Department of Materials Science and Engineering, University of Texas at Dallas, Dallas, Texas 75080, USA
9:Department of Materials Science and Engineering, University of California at Irvine, Irvine, California 92697, USA
10:Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM), Cornell University, Ithaca, New York 14853, USA
11:School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA
12:Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA
13:Leibniz-Institut für Kristallzüchtung, 12489 Berlin, Germany
a)Author to whom correspondence should be addressed: schlom@cornell.edu

Data related to the film growth and structural characterization by RHEED, XRD, AFM, and chemical characterization by SIMS.

AFM Characterization
ItemTypeFile
AFM Characterization - A18_SnO389_2nm_2.196nmdataAFM Characterization/A18_SnO389_2nm_2.196nm.ibw
AFM Characterization - A18_SnO389_amp_2nm_2.196nmimageAFM Characterization/A18_SnO389_amp_2nm_2.196nm.png
AFM Characterization - A18_SnO389_h_2nm_2.196nmimageAFM Characterization/A18_SnO389_h_2nm_2.196nm.png
AFM Characterization - A20_SnO383_2um_1.955nmdataAFM Characterization/A20_SnO383_2um_1.955nm.ibw
AFM Characterization - A20_SnO383_amp_2um_1.955nmimageAFM Characterization/A20_SnO383_amp_2um_1.955nm.png
AFM Characterization - A21_SnO372_2um-2dataAFM Characterization/A21_SnO372_2um-2.ibw
AFM Characterization - A21_SnO372_amp_2um-2imageAFM Characterization/A21_SnO372_amp_2um-2.png
MBE Growth Logs
ItemTypeFile
MBE Growth Logs - Sample A10 Growth logzipMBE Growth Logs/MBE_A10.zip
MBE Growth Logs - Sample A11 Growth logzipMBE Growth Logs/MBE_A11.zip
MBE Growth Logs - Sample A12 Growth logzipMBE Growth Logs/MBE_A12.zip
MBE Growth Logs - Sample A13 Growth logzipMBE Growth Logs/MBE_A13.zip
MBE Growth Logs - Sample A14 Growth logzipMBE Growth Logs/MBE_A14.zip
MBE Growth Logs - Sample A15 Growth logzipMBE Growth Logs/MBE_A15.zip
MBE Growth Logs - Sample A16 Growth logzipMBE Growth Logs/MBE_A16.zip
MBE Growth Logs - Sample A17 Growth logzipMBE Growth Logs/MBE_A17.zip
MBE Growth Logs - Sample A18 Growth logzipMBE Growth Logs/MBE_A18.zip
MBE Growth Logs - Sample A20 Growth logzipMBE Growth Logs/MBE_A20.zip
MBE Growth Logs - Sample A21 Growth logzipMBE Growth Logs/MBE_A21.zip
MBE Growth Logs - Sample A6 Growth logzipMBE Growth Logs/MBE_A6.zip
MBE Growth Logs - Sample A7 Growth logzipMBE Growth Logs/MBE_A7.zip
MBE Growth Logs - Sample A8 Growth logzipMBE Growth Logs/MBE_A8.zip
MBE Growth Logs - Sample A9 Growth logzipMBE Growth Logs/MBE_A9.zip
RHEED Characterization
ItemTypeFile
RHEED Characterization - sc003_K_300C_K_doped_SnO 2dataRHEED Characterization/sc003_K_300C_K_doped_SnO 2.img
RHEED Characterization - sc003_K_300C_K_doped_SnOdataRHEED Characterization/sc003_K_300C_K_doped_SnO.img
RHEED Characterization - sc004_K_doped_SnO_10nm_1E19_165degdataRHEED Characterization/sc004_K_doped_SnO_10nm_1E19_165deg.img
RHEED Characterization - sc004_K_doped_SnO_10nm_1E19_1degdataRHEED Characterization/sc004_K_doped_SnO_10nm_1E19_1deg.img
RHEED Characterization - sc004_K_doped_SnO_10nm_1E19_245degdataRHEED Characterization/sc004_K_doped_SnO_10nm_1E19_245deg.img
RHEED Characterization - sc004_K_doped_SnO_10nm_1E19_90degdataRHEED Characterization/sc004_K_doped_SnO_10nm_1E19_90deg.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19dataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19_0degdataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19_0deg.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19_1degdataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19_1deg.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19_245degdataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19_245deg.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19_70degdataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19_70deg.img
RHEED Characterization - sc004_K_doped_SnO_5nm_1E19_90degdataRHEED Characterization/sc004_K_doped_SnO_5nm_1E19_90deg.img
RHEED Characterization - sc008_K_doped_SnO_60nm_K_225C_65degdataRHEED Characterization/sc008_K_doped_SnO_60nm_K_225C_65deg.img
RHEED Characterization - sc008_K_doped_SnO_60nm_K_225C_71degdataRHEED Characterization/sc008_K_doped_SnO_60nm_K_225C_71deg.img
RHEED Characterization - sc008_K_doped_SnO_60nm_K_225C_97degdataRHEED Characterization/sc008_K_doped_SnO_60nm_K_225C_97deg.img
SIMS Characterization
ItemTypeFile
SIMS Characterization - Sample A10spreadsheetSIMS Characterization/A10_SnO_167.xlsx
SIMS Characterization - Sample A11spreadsheetSIMS Characterization/A11_SnO_229.xlsx
SIMS Characterization - Sample A12spreadsheetSIMS Characterization/A12_SnO_227.xlsx
SIMS Characterization - Sample A13spreadsheetSIMS Characterization/A13_SnO_163.xlsx
SIMS Characterization - Sample A14spreadsheetSIMS Characterization/A14_SnO_369.xlsx
SIMS Characterization - Sample A15spreadsheetSIMS Characterization/A15_SnO_223.xlsx
SIMS Characterization - Sample A16spreadsheetSIMS Characterization/A16_SnO_176.xlsx
SIMS Characterization - Sample A17spreadsheetSIMS Characterization/A17_SnO_240.xlsx
SIMS Characterization - Sample A18spreadsheetSIMS Characterization/A18_SnO_389.xlsx
SIMS Characterization - Sample A6spreadsheetSIMS Characterization/A6_SnO_244.xlsx
SIMS Characterization - Sample A7spreadsheetSIMS Characterization/A7_SnO_228.xlsx
SIMS Characterization - Sample A8spreadsheetSIMS Characterization/A8_SnO_166.xlsx
SIMS Characterization - Sample A9spreadsheetSIMS Characterization/A9_SnO_427.xlsx
XRD Characterization
ItemTypeFile
XRD Characterization - XRD CharacterizationzipXRD Characterization/XRD Characterization.zip